题目:Feature Reduction and RBFNN Architecture Selection for Supervised Pattern Classification Problems using Localized Generalization Error Model
报告人:Prof. Daniel Yeung
IEEE Fellow, IEEE Distinguished Lecturer
Department of Computing, Hong Kong Polytechnic University, Hong Kong
时间: 30 March 2006 (Thursday), 10:00~12:00 AM
地点: North 401, Weilun Building, School of Economics and Management, Tsinghua University