题目：Feature Reduction and RBFNN Architecture Selection for Supervised Pattern Classification Problems using Localized Generalization Error Model
报告人：Prof. Daniel Yeung
IEEE Fellow, IEEE Distinguished Lecturer
Department of Computing, Hong Kong Polytechnic University, Hong Kong
时间: 30 March 2006 (Thursday), 10:00~12:00 AM
地点: North 401, Weilun Building, School of Economics and Management, Tsinghua University
